NDC Infrared Engineering's X-Ray Flurorescence Magnetic Media Thickness Sensor Model 105T







			X-Ray Fluorescence Magnetic Media Thickness Sensor Model 105T Continuously measures and controls the thickness/weight of selected elements on nonmetallic bases or substrates. Typical applications include computer video and audio tapes, floppy discs, etc. Features Accurate measurement of thin coatings (40 - 900 microinches) Non-Contact, Measures From One Side Patented AGC Requires No Re-standardizing Unaffected by Binders or Substrate Thickness Variations Simple Installation in Small Spaces Reliable, Low Cost Insensitive to Passline Variations Up to ± 60 mils (± 1.5mm) Small Measuring Spot - 0.28 inches (7mm) Description The NDC Infrared Engineering Model 105T Thickness Sensor affords simple, reliable, continuous and accurate measurement of thin coatings on nonmetallic films or substrates. Materials selected for measurement are typically elements of high atomic number such as Iron Oxide, Zinc, etc. A small sensor probe is mounted on one side of the measured material. There is no need to contact the sheet or web. A 32 bit CPU powers a touchscreen interface for displays, operator interface, entry of product recipes, reports, etc. Theory of Operation The measurement technique is based upon the principle of x-ray fluorescence. In the sensor probe, a small radioactive isotope emits gamma rays which excite the orbital electrons of the metallic atoms in the coating. The excited atoms reradiate x-rays (fluoresce) at a different frequency than that emitted by the source isotope. The intensity of the reradiated x-rays is proportional to the mass of the metallic coating, hence, thickness. An efficient scintillation/photomultiplier x-ray detector converts the x-rays to a pulse rate proportional to the intensity which in turn is converted to a digital thickness display. Unique to the NDC Infrared Engineering gauge is a patented automatic gain control (AGC) technique that automatically compensates the detector for aging, ambient temperature changes, and supply voltage variations. This eliminates the need for frequent restandardization required by other techniques. Technical Specifications for the X-Ray Fluorescence Magnetic Media Thickness Sensor